Thermography can make an important contribution to the development and manufacture of solar cells and modules, as well as to the inspection of solar systems. This testing method is employed to
Efficiently detect performance losses in cells and modules
Identify defective cells and modules
Analyze solar cells of all types (TOPCon, Heterojunction, PERC, BC, etc.) in a contactless and non-destructive manner
Increasing the efficiency of solar cells is one of the key priorities in photovoltaic research. Recent developments have led to increasingly complex, multi-layer cell structures. Active thermography enables non-destructive testing of individual solar cell layers and the detection of faults through hot spots.
Passive thermography – a reliable and established method for functional testing and characterization of large solar modules – quickly reaches its limits when it comes to continuous production monitoring and solar cell research and development. However, Lock-in Thermography combined with high-performance infrared cameras can detect temperature differences in the microkelvin range. These local heating effects are caused by cell defects during contactless (Light Modulated Lock-in Thermography, LimoLIT) or contact-based (Voltage-modulated Lock-in Thermography, VomoLIT) periodic excitation of the test object.
The so-called leakage current plays a decisive role in efficiency and thus the overall performance of a solar cell. This loss current, which negatively affects the efficiency of the solar cell, is mainly caused by thermally excited charge carriers in the semiconductor material that diffuse across the space charge zone of the pn junction diode – opposite to the direction of the photocurrent.
Causes of high leakage currents include for example material defects, impurities, and surface or edge defects. Passivation defects, which play a particularly important role in PERC solar cells (Passivated Emitter and Rear Cell), are also associated with increased leakage currents.
Thermographic analyses of solar cells have shown that leakage currents are practically never homogeneous across the entire surface of the cell. There are areas with low leakage currents and areas where they are locally increased, often by a factor of 10 to 1,000. These areas with high leakage currents are referred to as shunts. Lock-in Thermography allows the detection and quantitative evaluation of such shunts in solar cells.
The deployed thermography software is key to detecting these defects. It allows important test parameters such as excitation and recording frequency or excitation amplitude to be set and also enables evaluation using various active thermal imaging algorithms, comparison of measurement data, and storage of results. The information obtained helps to locate the corresponding defects and narrow down the causes of performance losses.
Reliable defect detection (shunts), for example, detection of leakage currents in solar cells and modules using Lock-in Thermography
Analysis of test objects with structures down to a few micrometers (µm) in size and a thermal resolution in the microkelvin range
Detection and precise localization of even weak local shunts by reducing the influence of lateral heat spread (silicon is a good heat conductor)
For detailed analysis of solar cells, InfraTec offers the automated thermographic system PV-LIT, which can be used for all types and formats of solar cells and modules. Excitation is carried out electrically or contactlessly with light.