Online Event: Thermografie-Anwenderkonferenz „Forschung & Entwicklung“ (November 2026)
Our free of charge “Thermografie-Awenderkonferenz” (thermography user conference) on November 5, 2026 provides a forum for professional exchange among users from academia and industry, with a particular focus on applications of thermography for demanding tasks in research and development.
Online Event “Thermografie-Anwenderkonferenz – Forschung & Entwicklung”
Date: Thursday, November 5, 2026
Time: 10:00 AM – 03:00 PM (CET)
Language: German
Price: free of charge
Infrared thermography has developed into a versatile measurement method used, among other things, in electronics for fault detection and localization, in quality control for additive manufacturing, and in thermal flow analysis. Event participants will experience first-hand what the technology is currently capable of, how camera technology is being continuously advanced, and what evaluation options state-of-the-art software provides. In addition, participants will get to know exciting new products as well as InfraTec’s well thought out system solutions.
As part of the Anwenderkonferenz, attendees gain a solid understanding of the physical fundamentals, metrological relationships, and typical influencing factors—knowledge that helps users carry out thermographic measurements with greater confidence and assess the results more reliably. Speakers from industry and science will present interesting measurement tasks with a focus on research and development. The practical insights into the methodologies of experienced users are intended to help participants assess and leverage the potential of thermography even more specifically for their future measurement tasks.
Technical lectures from thermography practice:
Technical lecture 1 in German
Title: „Unsichtbare Wege – Thermografie zeigt Flugbahnen von Fledermäusen“
Speaker: Dipl.-Biol. Wigbert Schorcht; SWILD, Zürich & NACHTaktiv, Erfurt
Technical lecture 2 in German
Title: "Thermografie in der Mikroelektronik – Von der Fehlerlokalisierung zur Degradationsanalyse"
Speaker: Dominic Muß, Manager Analysis of Reliable and Trusted Electronics (CS-ARTE), Fraunhofer-Institut für Elektronische Mikrosysteme und Festkörper-Technologien EMFT